Characterization of CdTe x-ray sensor layer on Medipix detector chips

R. Aamir, M. F. Walsh, S. P. Lansley, R. M. Doesburg, R. Zainon, N. J.A. De Ruiter, P. H. Butler, A. P.H. Butler

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

We have been characterizing various sensor layers bump-bonded to Medipix detector chips. We report here characterization of a cadmium telluride (CdTe)-Medipix2 assembly. CdTe is expected to be a useful sensor layer for clinical CT imaging detectors because of its good detection efficiency for x-rays in the energy range up to 120 keV. However, an understanding of the detection characteristics of these sensor layers is vital to high-quality imaging. We present leakage current variations with temperature and sensitivity inhomogeneity across the detector. This is an extension of the tests previously reported in Aamir et al [1].

Original languageBritish English
Title of host publicationAdvanced Materials and Nanotechnology, AMN-5
Pages170-173
Number of pages4
DOIs
StatePublished - 2012
Event5th Biennial Conference on Advanced Materials and Nanotechnology, AMN-5 - Wellington, New Zealand
Duration: 7 Feb 201111 Feb 2011

Publication series

NameMaterials Science Forum
Volume700
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference5th Biennial Conference on Advanced Materials and Nanotechnology, AMN-5
Country/TerritoryNew Zealand
CityWellington
Period7/02/1111/02/11

Keywords

  • Cadmium Telluride
  • Compound semiconductors
  • Gold nano-particles
  • MARS-CT
  • Medipix
  • Sensitivity variations
  • X-ray detectors

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