Band gap variation of CdInSe and CdZnS fabricated by high throughput combinatorial growth technique

  • Z. X. Ma
  • , H. Y. Hao
  • , P. Xiao
  • , L. J. Oehlerking
  • , D. F. Liu
  • , X. J. Zhang
  • , K. M. Yu
  • , W. Walukiewicz
  • , S. S. Mao
  • , P. Y. Yu
  • , Lei Liu
  • , Peter Y. Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

High energy radiation detector operating at room temperature requires the semiconductors having band-gap energies in the range of 1.35 ∼ 2.5 eV, high Z and high carrier mobility-lifetime (μτ) product. We report here the screening of the band-gap energies of compound semiconductor CdIn 2Se 4 and ZnCdS doped with Sn and In, prepared by high throughput combinatorial growth technique. It is found that the band-gap energies decrease as [Cd] decreases in Cd 1-xIn 2+2xSe 4+2x, and as In or Sn elements are incorporated in Zn xCd 1-xS. For both libraries, the μτ can reach a value on the order of 10 -4cm 2/V. These results have demonstrated the strong capability of the combinatorial growth technique in rapid material discovery for room temperature radiation detector applications.

Original languageBritish English
Title of host publicationPhysics of Semiconductors - 30th International Conference on the Physics of Semiconductors, ICPS-30
Pages1059-1060
Number of pages2
DOIs
StatePublished - 2011
Event30th International Conference on the Physics of Semiconductors, ICPS-30 - Seoul, Korea, Republic of
Duration: 25 Jul 201030 Jul 2010

Publication series

NameAIP Conference Proceedings
Volume1399
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference30th International Conference on the Physics of Semiconductors, ICPS-30
Country/TerritoryKorea, Republic of
CitySeoul
Period25/07/1030/07/10

Keywords

  • combinatorial technique
  • mobility and lifetime
  • semiconductor band-gap

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