Automated numerical characterization of dilute semiconductors per comparison with luminescence

X. Yang; C. I. Oriaku; J. P. Zubelli; M. F. Pereira

doi:10.1007/s11082-017-0919-5

Automated numerical characterization of dilute semiconductors per comparison with luminescence

X. Yang, C. I. Oriaku, J. P. Zubelli, M. F. Pereira

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3 Scopus citations

Abstract

This paper combines analytical approximations for the optical absorption and luminescence of semiconductors with trust region-reflective methods, delivering a robust numerical characterization method to be used in the study of new bulk semiconductors per direct comparison with experimental spectra. It further extends recent applications of the theory to the case of dilute nitride semiconductors and confirms results for the s-shape of the luminescence peak as a function of temperature.

Original language	British English
Article number	93
Journal	Optical and Quantum Electronics
Volume	49
Issue number	3
DOIs	https://doi.org/10.1007/s11082-017-0919-5
State	Published - 1 Mar 2017

Keywords

Dilute nuitrides
Luminescence
Many body effects
Mid infrared
Semiconductors

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10.1007/s11082-017-0919-5

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@article{beed18f6421d480398145058d4f2cf58,

title = "Automated numerical characterization of dilute semiconductors per comparison with luminescence",

abstract = "This paper combines analytical approximations for the optical absorption and luminescence of semiconductors with trust region-reflective methods, delivering a robust numerical characterization method to be used in the study of new bulk semiconductors per direct comparison with experimental spectra. It further extends recent applications of the theory to the case of dilute nitride semiconductors and confirms results for the s-shape of the luminescence peak as a function of temperature.",

keywords = "Dilute nuitrides, Luminescence, Many body effects, Mid infrared, Semiconductors",

author = "X. Yang and Oriaku, {C. I.} and Zubelli, {J. P.} and Pereira, {M. F.}",

note = "Funding Information: The authors acknowledge support from COST ACTION MP1204, TERA-MIR Radiation: Materials, Generation, Detection and Applications. Publisher Copyright: {\textcopyright} 2017, The Author(s).",

year = "2017",

month = mar,

day = "1",

doi = "10.1007/s11082-017-0919-5",

language = "British English",

volume = "49",

journal = "Optical and Quantum Electronics",

issn = "0306-8919",

publisher = "Springer",

number = "3",

}

TY - JOUR

T1 - Automated numerical characterization of dilute semiconductors per comparison with luminescence

AU - Yang, X.

AU - Oriaku, C. I.

AU - Zubelli, J. P.

AU - Pereira, M. F.

PY - 2017/3/1

Y1 - 2017/3/1

N2 - This paper combines analytical approximations for the optical absorption and luminescence of semiconductors with trust region-reflective methods, delivering a robust numerical characterization method to be used in the study of new bulk semiconductors per direct comparison with experimental spectra. It further extends recent applications of the theory to the case of dilute nitride semiconductors and confirms results for the s-shape of the luminescence peak as a function of temperature.

AB - This paper combines analytical approximations for the optical absorption and luminescence of semiconductors with trust region-reflective methods, delivering a robust numerical characterization method to be used in the study of new bulk semiconductors per direct comparison with experimental spectra. It further extends recent applications of the theory to the case of dilute nitride semiconductors and confirms results for the s-shape of the luminescence peak as a function of temperature.

KW - Dilute nuitrides

KW - Luminescence

KW - Many body effects

KW - Mid infrared

KW - Semiconductors

UR - http://www.scopus.com/inward/record.url?scp=85011867561&partnerID=8YFLogxK

U2 - 10.1007/s11082-017-0919-5

DO - 10.1007/s11082-017-0919-5

M3 - Article

AN - SCOPUS:85011867561

SN - 0306-8919

VL - 49

JO - Optical and Quantum Electronics

JF - Optical and Quantum Electronics

IS - 3

M1 - 93

ER -

Automated numerical characterization of dilute semiconductors per comparison with luminescence

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Keywords

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