Approaching repetitive short circuit tests on MW-scale power modules by means of an automatic testing setup

Paula Diaz Reigosa, Huai Wang, Francesco Iannuzzo, Frede Blaabjerg

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    An automatic testing system to perform repetitive short-circuit tests on megawatt-scale IGBT power modules is presented and described in this paper, pointing out the advantages and features of such testing approach. The developed system is based on a non-destructive short-circuit tester, which has been integrated with an advanced software tool and a semiconductor device analyzer to perform stress monitoring on the considered device under test (DUT). A case-study is included in the paper concerning a 1.7 kV/ 1 kA IGBT module, which has been tested safely up to 30,000 repetitions with no significant damage. The developed system has been demonstrated to be very helpful in performing a large number of repetition tests as required by modern testing protocols for robustness and reliability assessment. The software algorithm and a demonstration video are available for download.

    Original languageBritish English
    Title of host publicationECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781509007370
    DOIs
    StatePublished - 2016
    Event2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016 - Milwaukee, United States
    Duration: 18 Sep 201622 Sep 2016

    Publication series

    NameECCE 2016 - IEEE Energy Conversion Congress and Exposition, Proceedings

    Conference

    Conference2016 IEEE Energy Conversion Congress and Exposition, ECCE 2016
    Country/TerritoryUnited States
    CityMilwaukee
    Period18/09/1622/09/16

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