Application of dynamic supply current monitoring to testing mixed-signal circuits

Mahmoud A. Al-Qutayri, Peter R. Shepherd

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (iDDT) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.

Original languageBritish English
Pages (from-to)223-240
Number of pages18
JournalVLSI Design
Volume5
Issue number3
DOIs
StatePublished - 1997

Keywords

  • CMOS
  • Fault coverage
  • Mixed-signal
  • Supply current
  • Testability
  • VLSI

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