@inproceedings{05d4072fd2df48c8be2a1cc21d223d29,
title = "An intrinsic complexity model for the problem of total resistance determination",
abstract = "Any exam problem shows a specific level of intrinsic complexity that affects its solving time. This paper investigates the factors that affect the intrinsic complexity of determining the total resistance of a resistive circuit. A sample of 46 circuits was generated and solved by 27 students with time recording. Regression analysis showed that the solving time is significantly affected by the number of arithmetic operations required to solve the problem, by the value range of the resistors, as well as by the inconsistency of the given resistor units. Other factors that reflect the circuit topology including the number of circuit nodes and branches are either correlated with the number of arithmetic operations or insignificant in the regression analysis. The outcome of the study is a complexity model that can be used to predict the solving time of new problems of the same class which allows to develop more reliable exam problems. Different ways to control the complexity level are discussed in depth.",
author = "Abdulhadi Shoufan and Abdulla Alnaqbi",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 ; Conference date: 28-05-2017 Through 31-05-2017",
year = "2017",
month = sep,
day = "25",
doi = "10.1109/ISCAS.2017.8050517",
language = "British English",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "IEEE International Symposium on Circuits and Systems",
address = "United States",
}