@inproceedings{516f37bb5f1d443dbafb31f985aa6d93,
title = "An efficient resistance sensitivity extraction algorithm for conductors of arbitrary shapes",
abstract = "Due to technology scaling, integrated circuit manufacturing techniques are producing structures with large variabilities in their dimensions. To guarantee high yield, the manufactured structures must have the proper electrical characteristics despite such geometrical variations. For a designer, this means extracting the electrical characteristics of a whole family of structure realizations in order to guarantee that they all satisfy the required electrical characteristics. Sensitivity extraction provides an efficient algorithm to extract all realizations concurrently. This paper presents a complete frame-work for efficient resistance sensitivity extraction. The framework is based on both the Finite Element Method (FEM) for resistance extraction and the adjoint method for sensitivity analysis. FEM enables the calculation of resistances of interconnects of arbitrary shapes, while the adjoint method enables sensitivity calculation in a computational complexity that is independent of the number of varying parameters. The accuracy and efficiency of the algorithm are demonstrated on a variety of complex examples.",
keywords = "Adjoint method, Finite-element method, Resistance extraction, Sensitivity, Shape variations",
author = "Tarek El-Moselhy and Elfadel, {I. M.} and Bill Dewey",
year = "2009",
doi = "10.1145/1629911.1630110",
language = "British English",
isbn = "9781605584973",
series = "Proceedings - Design Automation Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "770--775",
booktitle = "2009 46th ACM/IEEE Design Automation Conference, DAC 2009",
address = "United States",
note = "2009 46th ACM/IEEE Design Automation Conference, DAC 2009 ; Conference date: 26-07-2009 Through 31-07-2009",
}