@inproceedings{4aeb848660654112951c64d7addf8aee,
title = "An efficient reliability evalu ation approach for system-level design of embedded systems",
abstract = "A system-level design process of reliable systems demands efficient reliability evaluation of the explored design alternatives. This paper presents a new approach to accelerate the reliability evaluation and, thus, the design space exploration for reliable systems. A new data structure denoted as System Error Decision Diagram (SEDD) is proposed, which is based on both binary decision diagrams to model permanent errors and zero-suprressed decision diagrams to model transient errors. Both contructing the SEDD diagram and evaluating reliability based on it are detailed in an algorithmic way. The proposed approach is demonstrated for a control system taken from the automotive domain.",
keywords = "Embedded system, Permanent error, Reliability evaluation, System Error Decision Diagram, System-level design, Transient error",
author = "Adeel Israr and Abdulhadi Shoufan and Huss, {Sorin A.}",
year = "2009",
doi = "10.1109/ISQED.2009.4810317",
language = "British English",
isbn = "9781424429530",
series = "Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009",
pages = "339--344",
booktitle = "Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009",
note = "10th International Symposium on Quality Electronic Design, ISQED 2009 ; Conference date: 16-03-2009 Through 18-03-2009",
}