Adhesion characteristics of underfill material with various package components after plasma and UV/ozone treatments

  • Man Lung Sham
  • , Mei Lam
  • , Jang Kyo Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

The role of underfill in enhancing the reliability of flip chip packages is of paramount importance, particularly for the low-cost packages made of organic printed circuit boards. Amongst many reliability issues in flip chip packages, delamination between the underfill and other package components is detrimental to the mechanical and functional performance of the package because delamination often leads to premature failure of the whole device. In the present study, the interfacial bond strengths of both conventional and no-flow underfill resins with die passivation, solder, and polyimide soldermask are measured based on the button shear test; and the surface characteristics of these substrates are analysed using several analytical tools, including atomic force microscopy, X-ray photoelectron spectroscopy and contact angle measurement. Plasma and UV/ozone treatments are applied before encapsulation to improve the underfill-package component interface bond. It is found that the interfacial bond strength of underfill with solder was the weakest, while it was highest with silicon nitride passivation layer amongst the above substrates studied. Both plasma and UV/ozone treatments improved the interfacial bond strength with polyimide soldermask along with a decrease in contact angle of the surface. Among the various thermodynamic parameters the spreading coefficient was shown to have close correlation with the underfill-solder interfacial bond strength. The significance of this finding is discussed.

Original languageBritish English
Title of host publicationAdvances in Electronic Materials and Packaging 2001
EditorsS.B. Lee, K.W. Paik
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages208-215
Number of pages8
ISBN (Electronic)0780371577, 9780780371576
DOIs
StatePublished - 2001
Event3rd International Symposium on Electronic Materials and Packaging, EMAP 2001 - Jeju Island, Korea, Republic of
Duration: 19 Nov 200122 Nov 2001

Publication series

NameAdvances in Electronic Materials and Packaging 2001

Conference

Conference3rd International Symposium on Electronic Materials and Packaging, EMAP 2001
Country/TerritoryKorea, Republic of
CityJeju Island
Period19/11/0122/11/01

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