A Stress Emulation Method for Concurrent Testing of AC and DC Capacitors

Bo Yao, Xing Wei, Haoran Wang, Huai Wang

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations

    Abstract

    This paper proposes a capacitor testing method that can concurrently emulate the electrical stresses of both AC and DC capacitors for high-power converter applications. It preserves the advantages of a recently reported method with a minimum required power sup-plies and is robust to testing sample degradation, which, however, limits to test either AC or DC capacitors. The circuit architecture and application examples are presented. Experimental results verify the feasibility and effectiveness of the proposed testing method.

    Original languageBritish English
    Title of host publication2022 International Power Electronics Conference, IPEC-Himeji 2022-ECCE Asia
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages2552-2556
    Number of pages5
    ISBN (Electronic)9784886864253
    DOIs
    StatePublished - 2022
    Event2022 International Power Electronics Conference, IPEC-Himeji 2022-ECCE Asia - Himeji, Japan
    Duration: 15 May 202219 May 2022

    Publication series

    Name2022 International Power Electronics Conference, IPEC-Himeji 2022-ECCE Asia

    Conference

    Conference2022 International Power Electronics Conference, IPEC-Himeji 2022-ECCE Asia
    Country/TerritoryJapan
    CityHimeji
    Period15/05/2219/05/22

    Keywords

    • AC capaci-tors
    • converter applications
    • DC capacitors
    • Electrical stresses

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