A Simplified On-State Voltage Measurement Circuit for Power Semiconductor Devices

Yingzhou Peng, Huai Wang

    Research output: Contribution to journalArticlepeer-review

    23 Scopus citations

    Abstract

    This letter proposes a simplified converter-level on-state voltage measurement circuit for power semiconductor devices, without an external power supply and self-power circuit. It has a reduced component count and circuit complexity, and retains the plug-and-play feature, comparable measurement accuracy, and dynamic response as recently reported methods. A proof-of-concept prototype is developed and tested for a three-phase inverter application.

    Original languageBritish English
    Article number9394787
    Pages (from-to)10993-10997
    Number of pages5
    JournalIEEE Transactions on Power Electronics
    Volume36
    Issue number10
    DOIs
    StatePublished - Oct 2021

    Keywords

    • Condition monitoring
    • converter-level
    • on-state voltage
    • power semiconductor
    • reliability

    Fingerprint

    Dive into the research topics of 'A Simplified On-State Voltage Measurement Circuit for Power Semiconductor Devices'. Together they form a unique fingerprint.

    Cite this