A Robust Testing Method for DC and AC Capacitors With Minimum Required Power Supply

Bo Yao, Qian Wang, Haoran Wang, Kazunori Hasegawa, Huai Wang

    Research output: Contribution to journalArticlepeer-review

    7 Scopus citations

    Abstract

    This letter proposes a testing method to emulate realistic stress conditions of dc and ac capacitors, with minimum required power supply and robust operation at the presence of capacitor degradation. It is especially suitable for parameter characterization and accelerated degradation testing of high-voltage and high-ripple current power electronic capacitors. The circuit architecture of the proposed testing method and the constraints of the testing samples under given designs are discussed. Proof-of-concept experiments on both dc and ac capacitors verify the feasibility.

    Original languageBritish English
    Pages (from-to)4942-4946
    Number of pages5
    JournalIEEE Transactions on Power Electronics
    Volume37
    Issue number5
    DOIs
    StatePublished - 1 May 2022

    Keywords

    • AC capacitor
    • dc capacitor
    • degradation testing
    • power electronics

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