A granular modeling method for non-uniform panel degradation based on I–V characterization and electroluminescence imaging

Martin Garaj, Henry Shu Hung Chung, Sergiu Spataru, Alan Wai Lun Lo, Huai Wang

    Research output: Contribution to journalArticlepeer-review

    Abstract

    A new model of photovoltaic (PV) panel is proposed. The model precisely replicates sub-cell level degradation, such as cracks and interconnect failures, and reproduces their effect at the panel level I–V characteristic. Moreover, a regression method is proposed, which infers the model's parameters from combination of electroluminescent (EL) image and degraded I–V characteristic. The combination of quantitative (EL image) and qualitative (I–V characteristic) enables to characterize the degradation of the cells embedded in the PV panel, without physical access to the cells. The proposed model and the regression problem is experimentally verified on a set of 3 single cell measurements and a set of 4 crystalline PV panels with various levels of degradation.

    Original languageBritish English
    Pages (from-to)162-178
    Number of pages17
    JournalSolar Energy
    Volume227
    DOIs
    StatePublished - Oct 2021

    Keywords

    • Degradation modeling
    • Evolutionary algorithm
    • Preventive diagnostics

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