TY - JOUR
T1 - A gain-controlled, low-leakage dickson charge pump for energy-harvesting applications
AU - Mahmoud, Abdulqader
AU - Alhawari, Mohammad
AU - Mohammad, Baker
AU - Saleh, Hani
AU - Ismail, Mohammed
N1 - Funding Information:
Manuscript received June 16, 2018; revised October 8, 2018 and December 16, 2018; accepted January 22, 2019. Date of publication February 20, 2019; date of current version April 24, 2019. This work was supported in part by the Mubadala-SRC Center of Excellence for Energy Efficient Electronic Systems Research Under Contract 2013-HJ2440 and in part by the Khalifa SOC Center. (Corresponding author: Baker Mohammad.) A. Mahmoud, B. Mohammad, and H. Saleh, are with the System On Chip Center, Khalifa University, Abu Dhabi, United Arab Emirates (e-mail: [email protected]; [email protected]; [email protected]).
Publisher Copyright:
© 1993-2012 IEEE.
PY - 2019/5
Y1 - 2019/5
N2 - This paper presents a single-stage power management unit to boost and regulate a low supply voltage for CMOS system-on-chip (SoC) applications. It consists of low-leakage, enhanced Dickson charge pump (DCP) that utilizes both stage and frequency modulation (FM) techniques to achieve high efficiency and lower area. In addition, the proposed design uses an enhanced stage-switch structure for the charge pump, which significantly reduces the cross-stage leakage. A stage number controller is used to control the gain of the charge pump by changing the number of stages based on the desired output voltage. FM is utilized to further fine-tune the output voltage through a closed-loop control based on a predetermined reference voltage. Silicon measurement results for the four-stage charge pump in 65-nm CMOS technology show a maximum end-to-end efficiency of 66% at an input voltage of 0.7 V and an output power of 27~\mu \text{W}. The proposed design achieved more than a 100\times reduction in leakage compared to traditional DCP. The system supports a range of load currents between 0.1 and 34~\mu \text{A} with a maximum operating frequency of 1.8 MHz. The proposed system supports an input voltage range of 0.55-0.7 V which makes it an excellent candidate for solar and thermal energy-harvesting applications targeting low-power internet-of-things SOC.
AB - This paper presents a single-stage power management unit to boost and regulate a low supply voltage for CMOS system-on-chip (SoC) applications. It consists of low-leakage, enhanced Dickson charge pump (DCP) that utilizes both stage and frequency modulation (FM) techniques to achieve high efficiency and lower area. In addition, the proposed design uses an enhanced stage-switch structure for the charge pump, which significantly reduces the cross-stage leakage. A stage number controller is used to control the gain of the charge pump by changing the number of stages based on the desired output voltage. FM is utilized to further fine-tune the output voltage through a closed-loop control based on a predetermined reference voltage. Silicon measurement results for the four-stage charge pump in 65-nm CMOS technology show a maximum end-to-end efficiency of 66% at an input voltage of 0.7 V and an output power of 27~\mu \text{W}. The proposed design achieved more than a 100\times reduction in leakage compared to traditional DCP. The system supports a range of load currents between 0.1 and 34~\mu \text{A} with a maximum operating frequency of 1.8 MHz. The proposed system supports an input voltage range of 0.55-0.7 V which makes it an excellent candidate for solar and thermal energy-harvesting applications targeting low-power internet-of-things SOC.
KW - Dickson charge pump (dcp)
KW - Energy harvesting (eh)
KW - Frequency modulation (fm)
KW - Power management unit (PMU)
KW - Solar cell
KW - Stage number controller
KW - System on chip (soc)
KW - Thermal harvesting
UR - http://www.scopus.com/inward/record.url?scp=85065099373&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2019.2897046
DO - 10.1109/TVLSI.2019.2897046
M3 - Article
AN - SCOPUS:85065099373
SN - 1063-8210
VL - 27
SP - 1114
EP - 1123
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 5
M1 - 8645815
ER -