@inproceedings{832eb4a138154c45a0832729352810c2,
title = "A comprehensive investigation on the short circuit performance of MW-level IGBT power modules",
abstract = "This paper investigates the short circuit performance of commercial 1.7 kV / 1 kA IGBT power modules by means of a 6 kA Non-Destructive-Tester. A mismatched current distribution among the parallel chips has been observed, which can reduce the short circuit capability of the IGBT power module under short circuit conditions. Further Spice simulations reveal that the stray parameters inside the module play an important role in contributing to such a phenomenon.",
keywords = "Current Distribution, Insulated-Gate Bipolar Transistor (IGBT), Power Modules, Short Circuit",
author = "Rui Wu and {Diaz Reigosa}, Paula and Francesco Iannuzzo and Huai Wang and Frede Blaabjerg",
note = "Funding Information: This work is conducted under the Center of Reliable Power Electronics (CORPE) project framework at Aalborg University, Denmark Publisher Copyright: {\textcopyright} 2015 EPE Association and IEEE.; 17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015 ; Conference date: 08-09-2015 Through 10-09-2015",
year = "2015",
month = oct,
day = "27",
doi = "10.1109/EPE.2015.7311761",
language = "British English",
series = "2015 17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 17th European Conference on Power Electronics and Applications, EPE-ECCE Europe 2015",
address = "United States",
}
