@inproceedings{261bd888d2b44ca0ae051a65b1ecd1a6,
title = "A Comparative Study on Converter-Level On-State Voltage Measurement Circuits for Power Semiconductor Devices",
abstract = "The on-state voltage is a key characteristic parameter and relative to the health condition and junction temperature of power semiconductor devices. Hence, it is widely used to evaluate the reliability and realize the predictive maintenance of power devices. Recently, three converter-level measurement circuits are proposed, capable of extracting the on-state voltage of all power devices in a power converter with one circuit only. In this paper, a comparative study on these three converter-level circuits is given in terms of hardware design, operational performance, and practical implementation, which guides the selection and design of suitable measurement circuit for different applications. The comparisons are illustrated with theoretical analyses and experimental results.",
keywords = "Condition monitoring, Converter-level, On-state voltage, Power semiconductor devices, Reliability",
author = "Yingzhou Peng and Huai Wang",
note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 13th IEEE Energy Conversion Congress and Exposition, ECCE 2021 ; Conference date: 10-10-2021 Through 14-10-2021",
year = "2021",
doi = "10.1109/ECCE47101.2021.9595088",
language = "British English",
series = "2021 IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3638--3643",
booktitle = "2021 IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Proceedings",
address = "United States",
}
