@inproceedings{fff671bd5c8b4a94bbe2f429a293ae0b,
title = "A 4GS/s, 8.45 ENOB and 5.7fJ/conversion, digital assisted, sampling system in 45nm CMOS SOI",
abstract = "A 4GS/s sampling system achieved 8.45-ENOB linearity with 5.7fJ/conversion energy efficiency at 1V power supply and its gain can be adjusted in a digital manner. The measured IIP3 and IIP2 are 17.7dBm and 40dBm respectively. The ENOB of the sampler shows no degradation up to Nyquist frequency. An integrated phase rotator allows digital clock delay and duty cycle adjustment with sub-picosecond resolution. The sampling system tracks and settles in 1/4UI (62.5ps). Realized in a 45nm SOI CMOS the active area of the sampler is only 0.2×0.2mm2.",
author = "Sanduleanu, {M. A.T.} and S. Reynolds and Plouchart, {J. O.}",
year = "2011",
doi = "10.1109/CICC.2011.6055383",
language = "British English",
isbn = "9781457702228",
series = "Proceedings of the Custom Integrated Circuits Conference",
booktitle = "2011 IEEE Custom Integrated Circuits Conference, CICC 2011",
note = "33rd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2011 ; Conference date: 19-09-2011 Through 21-09-2011",
}