XRD PANalytical Empyrean

TECHNIQUES - Thin film analysis, XRD phase analysis, rocking curve - Crystal surface perfection - Powder X-ray diffraction, rapid scan typically 2 to 5 minutes - Offline analysis of data - Crystallographic orientation SPECIFICATIONS - Thin film analysis. The crystallographic texture and composition can be determined using XRD Phase Analysis - Rocking curve measurements allow the surface perfection to be determined - Powder XRD done at standard angular resolutions is extremely rapid and easy to perform. Very high angular resolution scans are possible to help solve difficult problems - Crystallographic orientation of samples up to 20 x 20 x 20 mms can be determined