Scanning Electron Microscope (SEM)

    Equipment/facility: Equipment

    Equipments Details


    It is used to study both the morphology and composition of various materials. SEM is a test that scans a sample with an electron beam to produce a magnified image for analysis. The method is also known as SEM analysis and SEM microscopy, and is used very effectively in microanalysis and failure analysis of solid inorganic materials.


    Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.