Nova Nano SEM

The FEI Nova NanoSEM 650 is a high-quality nanoscale research tool for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation. More samples, including the most non-conducting or contaminating materials, can equally be characterized or analyzed in the Nova NanoSEM 50 series, using its unique low vacuum capabilities. Characterization in low vacuum extends all the way up to ultra-high resolution, thanks to FEI€™s Helix detector technology. Small and large samples can easily be accommodated inside the large chamber, on the Nova NanoSEM™s high precision, high stability stages.