Micro-CT Scanner (Versa-520)

    Equipment/facility: Equipment

    • LocationShow on map

      B-008, Basement, ADRIC Building, SAS Al-Nakhil Campus

    Equipments Details


    ZEISS Xradia 520 Versa is the most advanced non-destructive 3D X-ray microscope that uniquely characterize the microstructure of materials including metals, alloys, abrasives, rocks and semiconductors, providing comprehensive submicron X-ray imaging solution for advanced scientific and industrial research. The machine has capability of acquiring 3D images of resolution≃40 to 0.4µm. It counts with its own software to acquire and stich 3D image data slices.


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