Equipments Details
Description
ZEISS Xradia 520 Versa is the most advanced non-destructive 3D X-ray microscope that uniquely characterize the microstructure of materials including metals, alloys, abrasives, rocks and semiconductors, providing comprehensive submicron X-ray imaging solution for advanced scientific and industrial research.
The machine has capability of acquiring 3D images of resolution≃40 to 0.4µm. It counts with its own software to acquire and stich 3D image data slices.

×
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.