Micro-CT Scanner (Versa-520)

    Equipment/facility: Equipment

    • LocationShow on map

      B-008, Basement, ADRIC Building, SAS Al-Nakhil Campus

    Equipments Details

    Description

    ZEISS Xradia 520 Versa is the most advanced non-destructive 3D X-ray microscope that uniquely characterize the microstructure of materials including metals, alloys, abrasives, rocks and semiconductors, providing comprehensive submicron X-ray imaging solution for advanced scientific and industrial research. The machine has capability of acquiring 3D images of resolution≃40 to 0.4µm. It counts with its own software to acquire and stich 3D image data slices.

    Fingerprint

    Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.