Equipments Details
Description
The Model 4200 Semiconductor Characterization System (4200-SCS) is an automated system that provides I-V, pulsed I-V, and C-V characterization of semiconductor devices and test structures. Its advanced digital sweep parameter analyzer combines speed and accuracy for deep sub-micron characterization.
×
![]()
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.