Keithley 4200-SCS Characterization System

    Equipment/facility: Equipment

    Equipments Details


    The Model 4200 Semiconductor Characterization System (4200-SCS) is an automated system that provides I-V, pulsed I-V, and C-V characterization of semiconductor devices and test structures. Its advanced digital sweep parameter analyzer combines speed and accuracy for deep sub-micron characterization.


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