Elite 300 Semi-automatic Prober + Keithley 4200-SCS Parameter Analyzer

The Elite 300 semi-automatic probe system incorporates state-of-the-art mechanical and electrical technologies, plus leverages advanced materials and leading-edge measurement techniques. Employing an innovative motion-control system, utilizing advanced high-speed linear motors, frictionless air-bearing technology, with ultra-accurate sub-­micron ceramic reference encoders, the Elite delivers unprecedented stepping accuracy and wafer planarity over the full temperature range. The Elite 300 features an ultra-stable, rigid, temperature-optimized platen complete with thermally matched components for temperature range of -60 °C to 300 °C. The hands-free, high-­stability microscope bridge mount brings higher levels of stability and control. The Keithley 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes. From basic I-V and C-V measurement sweeps to advanced ultra-fast pulsed I-V, waveform capture, and transient I-V measurements, the 4200-SCS provides the researcher or engineer with critical parameters needed for design, development or production.